SPM Probe Tips SPM probe tips are for general use in most AFM systems. Team Nanotec offers a wide variety of probes for: Surface Science, like MFM or EFM Material Science, like nano indentation Topography Imaging Step Height Measurements Large radius hemispherical tip Cone shaped tip combined with well defined hemispherical tip shape. Application space: Material Science, e.g. material characterization by nanoindentation. Product Information Hemisperical Cone Shaped Tip Probe tip with hemispherical apex, coated with metal carbide. Application Space: Material Science, e.g. nano identation. Product Information Improved Super Cone Product Information Super Sharp Improved Super Cone Application example: surface roughness measurements Product Information High resolution magnetic force microscopy High resolution magnetic probe tip with Co-alloy hard magnetic coating. Product Information High resolution electrostatic force microscopy High aspect ratio probe tip with conductive Pt coating on tip side. Tips are shipped with Al-reflex coating on laser side. Product Information Extended life high aspect ratio tips Product Information Frequency Measurement The package includes measured cantilever dimensions and measured Power Density Spectra and Quality factor, as well as the calculated stiffness using Sader's Methode. Product Information SEM - Images The SEM imaging package consists of SEM images and cantilever dimensions for each probe. Product Information Conformal Gold Coating Product Information
