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HR - EFM
High resolution electrostatic force microscopy

EFM-Tip
   High aspect ratio probe tip with conductive Pt coating.

Specifications:
Radius after coating :
Full cone angle:
< 25 nm
< 12°

Available cantilevers:
   l = 125 µm, C = 40 N/m, fo = 300 kHz
   l = 225 µm, C = 3.0 N/m, fo = 75 kHz


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