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Probe Tips for Scanning Force Microscopy
Team Nanotec offers a wide variety of scanning force microscopy probe tips.
Beside our standard products, we develop and manufacture customer specific
probe tips.
A general description of the cantilever chip can be found HERE.

Our main product groups are:


 1. Cone shaped probe tips
General purpose tips. E.g. for step hight and surface roughness measurements.

2. Coated probe tips
Coatings for magnetic force microscopy,
electrostatic force microscopy,  wear resistant  tips and other applications
are available.
CDR120 - Tip 3. Critical dimension re-entrant tips
Typical application of these tips: measurement of critical dimensions.





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