SPM probe tips are for general use in most AFM systems. Team Nanotec offers a wide variety of probes for:
Cone shaped tip combined with well defined hemispherical tip shape.
Application space: Material Science, e.g. material characterization by nanoindentation.
Probe tip with hemispherical apex, coated with metal carbide.
Application Space: Material Science, e.g. nano identation.
Application example: surface roughness measurements
High resolution magnetic probe tip with Co-alloy hard magnetic coating.
High aspect ratio probe tip with conductive Pt coating on tip side. Tips are shipped with Al-reflex coating on laser side.
Multipurpose tip for simultaneous measurement of roughness and large step height, with the tip being orthogonal to the sample surface.
The package includes measured cantilever dimensions and measured Power Density Spectra and Quality factor, as well as the calculated stiffness using Sader's Methode.
The SEM imaging package consists of SEM images and cantilever dimensions for each probe.